Variable Angle Laser Ellipsometer
Model No: HO-VALE-01
High Sensitivity
Wide Measurement Range
Variable Angle Spectroscopic Ellipsometer
Model No: HO-SE-01
Thin Film Characterization
Non-destructive & Non-contact technique
Magneto Optic Ellipsometry
Automated Thin film Test Station
(Magnetic Materials Characterization)
(Magnetic Materials Characterization)
Model: HO-A216MOE-PH
High research grade quality
Option for fully automatic control
Option for fully automatic control