Jandel Semi-Automatic Probe Stand with Micro Manipulation Stage
As per unit above, but with easily removable micrometer controlled X-Y stage
Jandel Semi-Automatic Probe Stand with Wafer Table
As per unit above, but with easily removable Multiposition Wafer Table
Jandel Semi-Automatic Probe Stand
Automated z-axis verion of the Jandel Multiheight Probe Stand.
The base can accomodate wafers up to 300mm diameter (pictured)
Samples up to 250mm high can be probed – longer probe supports for deeper samples available on request
Simple probe contact and return via push buttons, with current flow instigated on probe contact
Compatible for operation via the Jandel RM3000 Test Unit