RT-110
The Resistivity Tester is a non-contact bulk resistivity measurement tool for rapid classification of silicon wafers. It operates via eddy current technology.
The RT-110 resistivity tester is suitable for measurement of the resistivity and thickness of bare semiconductor wafers. The wafer handling is manual, the measurement starts automatically. The RT-110 can measure in 4 different resistivity ranges. Conductivity type determination is possible by the built-in P/N tester.
WT-2000P
The WT-2000PVN is a table top measurement system, capable of performing a variety of measurements on PV cells, wafers, and blocks. The base system includes the overhead functions, and you configure the measurement capabilities to match your specific needs, by selecting from the options below.
WT-2000PVN
The WT-2000PVN is a table top measurement system, capable of performing a variety of measurements on PV cells, wafers, and blocks. The base system includes the overhead functions, and you configure the measurement capabilities to match your specific needs, by selecting from the options below.