Jandel Hall Effect Four Point Probe

Low Profile Probe for Hall Measurements

Jandel Engineering Limited manufactures this low profile probe head for
use in making four point probe measurements associated with Hall
measurements.
All Jandel probes are built to a high level of mechanical accuracy.
Specifications for radii, spacing and planarity are verified by video inspection
system and optical interferometer. Loads are verified by electronic force gauge.
Each probe has upper and lower jeweled needle guides.
It should be noted that while this probe was manufactured for placing
between the poles of a magnet Jandel Engineering does not supply any other
equipment or accessories for such measurements.

Description

Probe Spacing 2.00mm square array only
Tolerance +/- 20 microns
Needles Tungsten carbide 1.00mm diameter
Radius 100 microns
Retraction to Pad 1.5 mm
Planarity +/- 0.025mm or better
Loads Fixed 100g
Electrical Leakage 1013 ohms resistance between needles at 500 volts
Low Profile Overall probe height 18.5mm

Note: Hall Effect measurements with a four point probe is a highly specialised area of measurement.
UNFORTUNATELY WE CANNOT OFFER ADVICE ON SOURCING THE ASSOCIATED EQUIPMENT, THE MEASUREMENT PROCESS OR METHOD.
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