The Resistivity Tester is a non-contact bulk resistivity measurement tool for rapid classification of silicon wafers. It operates via eddy current technology.
The RT-110 resistivity tester is suitable for measurement of the resistivity and thickness of bare semiconductor wafers. The wafer handling is manual, the measurement starts automatically. The RT-110 can measure in 4 different resistivity ranges. Conductivity type determination is possible by the built-in P/N tester.


Features and System specifications:

  • Resistivity range 0.01-20 Ωcm
  • Computer controlled operation
  • No sample preparation
  • Measurement time about 1s (excluding handling)
  • Manual wafer loading


  • Wafer Thickness Measurement in the range of 200 to 1000 µm
  • Probe for P/N conductivity type testing