S150-2 Spectrometer

S150-2-1024USB

S150-2-3648USB

The S150-2 spectrometer is designed for spectral analysis of electromagnetic radiation, for precise wavelength measurements of lasers(including diode and tunable ones) used in spectral instruments and lidars. The S150-2 is the best in its class of instruments, and it delivers the accuracy and reproducibility when measuring wavelengths, shapes and widths of spectral lines. The S150-2 achieves both high spectral resolution (less than 9pm) and wavelength accuracy of 1 pm. That is all that provides almost 100% reproducibility of the measurement results.

Description

The S150-2 spectrometer is a two-channel instrument. This feature in the design extends the consumer properties of S150-2. S150-2 can be successfully used in photometry if  it is equipped with two identical gratings in each channel. The use of gratings with different groove density in each channel makes it possible to choose the registration bandwidth and spectral resolution.

In each channel of the spectrometer, linear multi-element detectors are installed. Both detectors is able to acquire spectra simultaneously. Each channel provides a 30 mm focal plane width.  The input slits have a fixed size (the standard width is 25 μm).  The input slit widths can be modified on customer request in the range of 15 -40 μm. Illumination of the spectrometer entrance slits is carried out by the use of a two-channel optical fiber (one input and two outputs) or two single-channel optical fibers. The lighting can be performed directly without optical fibers.

In most cases, it is convenient to use one two-channel optical fiber, because often both channels complement each other and solve the same task. An example is the spectral characteristics measurement of laser lines. In one of the S150-2 channels, an Echelle grating can be installed for this purpose. The user has the opportunity to mark with a marker the spectral line that is observed in the spectrometer channel where a conventional grating is located, and the software automatically finds the given line in another channel where there is a high-precision grating (Echelle grating).

It is known that Echelle spectrometers can provide high-precision (up to 10 pm) wavelength measurements. The S150-2 spectrometer with a new non-linear calibration sets higher limits for the accuracy of the wavelength measurement (from 5 pm to 1 pm, depending on the spectrum order) over a wide spectral range of 200 -1100 nm.

The S150-2 spectrometer is a small-sized device that does not have moving elements in its design, and it has high long-term stability. High-precision calibration along with long-term stability of the spectrometer are necessary for precise wavelength control. Calibration and wavelength measurement must be carried out under the same conditions to avoid temperature effects. However, the conditions in which wavelength calibration were performed may differ from the conditions in which the instrument is currently used. Therefore, there is a possibility of spectral autocalibration  in the S150-2, which can be performed by the user at any time. This achieves reproducibility of measurements results for the entire lifetime of the instrument.

The S150-2 spectrometer is reliable, compact, with portable design, easy in operation. The software which is supplied with the device, provides collection, visualization and analysis of data. It has an intuitive interface. There are two models of S150-2: S150-2-1024USB and S150-2-3648USB, which differ in the photodetector.

 

Features and Advantages

  • High spectral resolution (up to 9 pm)
    Measurement of shape and width of the spectral line
  • High accuracy of wavelength determination (up to 1 pm)
  • Long-term stability. Fixed position of optical elements, small size
  • Automatic wavelength calibration. High accuracy and reproducibility of measurement results for the entire instrument lifetime
  • Easy-to-use software, possibility to solve non-standard problems

 

Application

  • Wavelength measuring of tunable lasers, analysis of the shape and width of the laser line
  • Photometric measurements. Measurement of fluorescent, Raman, and atomic-emission spectra
S150 2018 2

 

 

 

 

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. S150-2 SH OptL orang

 

 

 

 

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. book-2

Theory & Instructions
1. Spectral Instrument. Basic Concepts and Characteristics.
2. Spectral Device

 

Specifications

Optical system

Optical system: vertical–symmetrical (two spectrometers in one housing)
F/number: 1/9.3
Focal length: 158 mm
Mirror: spherical
Flat field: 29.2 x 0.2 mm or 25.6 x 0.5 mm
Size of diffraction grating: 15 x 15 х 3 mm
Spectral slit (entrance): 25 x 600 µm
Light input: with optical fiber
Overall sizes: 200 х 143 х 72 mm
Weight: 2.5 kg

Optics

Model  S150-2-1024USB
Diffraction grating, mm-1: 600 1200 75,Echelle
(200 nm, 120 order)
Spectral resolution, nm: < 0.4 < 0.2 0.015
Registration band, nm: from 268
to 258
from 133
to 107
 –
Dispersion, nm/mm: from 10.45 to 10.08 from 5.18 to 4.16 0.3
Wavelength accuracy, nm:  < 0.16  < 0.08 0.004

 

Model  S150-2-3648USB
Diffraction grating, mm-1: 600 1200 75,Echelle
(200 nm, 120 order)
Spectral resolution, nm: < 0.3 < 0.15 0.009
Registration band, nm: from 305
to 294
from 151
to 119
 –
Dispersion, nm/mm: from 10.44 to 10.06 from 5.18 to 4.09 0.3
Wavelength accuracy, nm:  < 0.04  < 0.02 0.001


Note:
 The wavelength registration band shows the width of the spectral range  simultaneously registered by a detector. Principally, a registration band is determined by width of a detector and by  choice of a diffraction grating. The registration band gets narrow with increasing of line density. To a lesser extent, a registration band depends on a wavelength, but with increasing of  line density this dependence is growing.

The specification contains the maximum and minimum values of the  registration band and dispersion which correspond to final (end) positions of  gratings. For example, for the model S150-2-1024USB with 600 l/mm grating the registration band 268 nm corresponds to the range of 200-468 nm and  258 nm corresponds to the range of 807-1065 nm. Thus, the registration band for this model can be selected in the spectral range  200-1065 nm.

 

Detection system

Model: S150-2-1024USB S150-2-3648USB
Photodetector: S8378-1024Q TCD 1304DG
Number of pixels: 1024 3648
Width of pixel: 25 µm 8 µm
Height of pixel: 500 µm 200 µm
Spectral response: 200 – 1065 nm 200 – 1100 nm
Min. exposure time: 2.1 ms 7.4 ms
Max. exposure time (20°С): 5.0 s 3 s
Min. interval between scans: 1.0 ms 1.0 ms
Dynamic range for one scan: 3600:1 1100:1
Analogue–to–digital converter (ADC): 14 bit, 16384 counts 12 bit, 4096 counts
Synchronization: internal, external internal, external
Interface: USB USB

Optical fibers

Configuration: two-channel (1 input, 2 outputs), one-channel (1 input, 1 output)
Fiber material: UV silica
Core: 200 µm
Length: Standard – 0.5m; 1 m; 2 m; any length possible on request
Numerical aperture: 0.12

Software “SpectraSP-L”

Spectrum visualization mode: separate / joint
Scanning modes: single-spectrum/ multi-spectra
Scanning: continuous / set number of cycles
Accumulation type: summing / averaging
Peaks processing: search / width and intensity measurement / report
Spectra smoothing: yes
Photometry mode: transmission / absorption
Automatic calibration: yes
Wavelength measurement of 2nd and 4th harmonic of tunable lasers with Echelle help: optional
Signal integration in the set wavelength range: yes
Real-time wavelength measurement: yes
Data compatibility with MS Office, EXCEL: yes

 

S150-2 overall sizes

Gratings

We propose a wide range of ruled and holographic diffraction gratings (15 x 15 x 3 mm) for UV, visible and IR regions to be used in the spectrometers of S150-2 series. Our specialists will help you to make a right choice of diffraction gratings for your tasks ensuring the best combination of high energetic efficiency and minimal stray light for different regions of a spectrum.

Diffraction gratings (15 x 15 x 3 mm) of UV and visible range for the devices of S150-2 series

Line density,
mm-1
Blaze wavelength,
nm
 *Reciprocal linear dispersion, nm/mm **Spectral range limited by detector sensitivity & the grating efficiency not less than 40%, nm Simultaneously registered spectral range, nm
S150-2-1024USB S150-2-3648USB
2400 270 2.49 200 – 540 60 70
1800 270 3.41 200 – 540 85 95
1800 500 3.11 335 – 1000 75 85
1200 280 5.2 200 – 560 130 145
1200 400 5.12 270 – 800 125 140
1200 500 5.03 335 – 1000 125 140
1200 600 4.91 400 – 1100 120 135
1200 750 4.67 500 – 1100 115 130
600 280 10.6 200 – 560 260 295
600 350 10.5 235 – 700 260 295
600 650 10.4 435 – 1100 255 290
600 750 10.3 500 – 1100 255 290
400 280 15.8 200 – 560 390 445
300 350 21.1 235 – 700 520 590
300 500 21.1 335 – 1000 520 590
300 600 21 400 – 1100 520 590
300 700 21 470 – 1100 520 590
200 350 31.7 235 – 700 785 890
200 500 31.6 335 – 1000 785 890
200 700 31.6 470 – 1100 785 890

* at the blaze wavelength

** spectral range for S150-2-3648USB. For S150-2-1024USB long-wavelength limit: 1065 nm instead of 1100 nm.

 

Echelle Grating, 75 mm-1

Wavelength, nm  Reciprocal linear dispersion, nm/mm Spectral resolution, nm Wavelength accuracy, nm
S150-2-1024USB S150-2-3648USB S150-2-1024USB S150-2-3648USB
200 0.302 0.015 0.009 0.004 0.001
400 0.603 0.03 0.0018 0.008 0.002
600 0.905 0.045 0.027 0.011 0.003
800 1.206 0.06 0.036 0.015 0.004
1000 1.508 0.075 0.045 0.019 0.005