Dört Nokta Probları

13 ürün listeleniyor

AIT 6-32/M3 Montaj Delikli Minyatür Kartuş Probu

(EN) Jandel Engineering Limited manufactures the miniature cartridge probe for use on AIT equipment. The 6-32 or M3 mounting holes also make it suitable for use in customers’ own stands.
This probe is very similar to the miniature cartridge probe with mounting key for use on older Napson equipment or Kokusai equipment and care should be taken not to confuse the two. If in doubt please contact us.
All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by electronic force gauge. Each probe has upper and lower jeweled needle guides.

Alessi Kompakt Prob Kafası

(EN) Jandel Engineering Limited manufactures the Compact Probe for use on Veeco FPP50000 and FPP100 equipment. It is also suitable for use on GRQ equipment or to replace square bodied probe heads manufactured by Alessi.
Some Veeco equipment requires a differently shaped probe (cartridge with lead). Please let us know if you are unsure which probe you require.

All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by electronic force gauge. Each probe has upper and lower jeweled needle guides.

CDE 6 Yol Konnektörlü Kartuş Probu

(EN) Jandel Engineering Limited manufactures the cartridge with 6-way connector probe head to be compatible with systems manufactured by CDE, Creative Design Engineering.
All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by electronic force gauge. Each probe has upper and lower jeweled needle guides.
The probe manufactured for KLA/Tencor/Prometrix tools is very similar, however the probes are not inter-changeable and great care should be taken, especially if both systems are in use on site. CDE compatible probe heads have a distinctive black nosepiece.

Jandel Çok Yakın Aralıklı Prob

(EN) This probe uses a staggered jewel arrangement in order to acheive probe spacing of 0.500mm spacing.
The picture to the left compres a ‘standard’ 1.591mm spacing probe with the 0.500mm spacing probe
This probe can be used for probing close to sample edges or where a sample has very small dimensions.

Jandel Hall Etkisi Dört Nokta Probu

(EN) Low Profile Probe for Hall Measurements

Jandel Engineering Limited manufactures this low profile probe head for
use in making four point probe measurements associated with Hall
measurements.
All Jandel probes are built to a high level of mechanical accuracy.
Specifications for radii, spacing and planarity are verified by video inspection
system and optical interferometer. Loads are verified by electronic force gauge.
Each probe has upper and lower jeweled needle guides.
It should be noted that while this probe was manufactured for placing
between the poles of a magnet Jandel Engineering does not supply any other
equipment or accessories for such measurements.

Jandel Macor Dört Nokta Probu

(EN) The Jandel Macor Probe head is suitable for use in a wide range of temperatures – approximately -190C to 300C (around 80K to 600K).
The high temperature is given for measurement in an oven. It is possible to measure samples are higher temperature where the sample is heated using a hotplate and the contact time with the sample is not excessive.

Jandel Özel Yapım Problar

(EN) We have produced various probes to customer specifications including three, four, five and six point probes.
If you require something out of the ordinary we would be pleased to discuss what options might be available as a solution.

Jandel Silindirik Dört Nokta Prob

(EN)

Cylindrical four point probe head

Jandel Engineering Limited manufactures the cylindrical four point probe head to be compatible with the Jandel Multiposition Wafer Probe, the Microposition Probe, the Multiheight Probe, The Multiheight/Microposition Probe, as well as some OEM mapping systems.
It can be built into customer engineered four point probe systems using an optional mounting adapter which Jandel offers.
All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by electronic force gauge. Each probe has upper and lower jeweled needle guides.

Jandel Yüksek Vakum Dört Nokta Probu

(EN) Cylindrical Probe For Use At High Vacuum

Jandel Engineering Limited manufactures a version of the cylindrical probe
which can be used at high vacuum.
The probe is unanodised and has had blind holes removed where possible.
High vacuum wire is used for the connections which are crimped rather than
soldered. A ruby ball is used for the insulation pad.
All Jandel probes are built to a high level of mechanical accuracy.
Specifications for radii, spacing and planarity are verified by video inspection
system and optical interferometer. Loads are verified by electronic force gauge.
Each probe has upper and lower jeweled needle guides.