MCV-2200
(EN) The MCV automatic mapping systems provide a mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
MCV-2500
(EN) The MCV automatic mapping systems provide a mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
MCV-530
(EN) The MCV-530 system is designed for the fast and reliable testing of dielectric and epitaxial layers by mercury probe, and it is ideal for R&D or small volume production.
MCV-530L
(EN) The MCV-530 system is designed for the fast and reliable testing of dielectric and epitaxial layers by mercury probe, and it is ideal for R&D or small volume production.