IR Seebeck Karakterizasyon Sistemleri

(EN) The IR Seebeck Characterization Systems are capable of measuring the Seebeck coefficient and electrical resistivity of a wide range of samples. Common Seebeck characterization devices available from other companies are restricted to bridge-type in-plane samples or other limited geometries. MicroXact’s system allows you to measure cross-plane through thin-films and across complex 3D structures as well as characterizing the voltage response to an applied current. By measuring the cross-plane value of thin-film thermoelectrics, this system gives you the unique capability of measuring the thermoelectric material in the same configuration that it would be used in a device. These unique systems can be designed to be capable of measuring over extremely wide temperature ranges from below 4K to over 800K.


Sorry, this entry is only available in Amerikan İngilizcesi.