Manyetik Prob İstasyonu

(EN) The MPS-C-300 and MPS-C-350 magnetic probe systems are the world’s first probe stations capable of providing three-dimensional magnetic field control around a device under test.

MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement. Spin-current and spin torque oscillator testing, magnetic simulation and identification of anisotropy of complex multilayer structures are just few examples applications of our MPS systems.