WT-1200B

(EN) Low Cost, Non-Contact Single-Point Measurement in Silicon

Both WT-1200 and WT-1200B provide fast, non-contact carrier lifetime measurement method that is capable of characterizing silicon material in each process step of solar cell manufacturing.

WT-1200 is designed to measure wafers from as-cut wafer to the finished solar cell. WT-1200B is a model for block measurements.

Açıklama

Sorry, this entry is only available in Amerikan İngilizcesi.