(EN) Jandel Engineering Limited offers the Multiposition Probe stand as a solution
for measurements on wafers up to 200mm diameter). The probe is available in two
sizes at the same cost. One size is for wafers up to 150mm diameter and the second
for wafers up to 200mm diameter. If small sized wafers are to be measured the
smaller version is more suitable for placement of the wafers on the measurement
table. The Θ movement clicks in four positions at 90 degrees and the linear
movement in up to 10 positions giving repeat placement accuracy of +/- 1mm.
(EN) Jandel Engineering Limited offers the Hand Applied Probe as a solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots.
The probe head can have loads of up to 200g per needle and the Hand Applied Probe has a large downward force of around 1.2Kg and so is not suitable for fragile unsupported samples. As a scale for size the main image above shows the Hand Applied Probe sitting on top of a 150mm silicon ingot.
(EN) Jandel Engineering Limited offers the Multiheight Probe stand as a solution for a wide variety of measurements. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
The Multiheight Probe can be supplied with 4 optional mounting holes which can accommodate optional mounting accessories such as an 8 inch wafer table or micropositioning X-Y stage.
(EN) Jandel Engineering Limited offers the Multiheight Probe stand with micrometer controlled X-Y stage as a solution for measurements on sample sizes from several mm square up to 300mm. The X-Y microposition table can be easily added when measurement of small samples is desired. With only four screws to undo it is easily removed, so that large samples up to 300mm diameter or ingots up to 250mm high can be accommodated (thicker samples can be accommodated on request).