Jandel Yüksekliği Ayarlanabilir Dört Nokta Prob Standı

(EN) Jandel Engineering Limited offers the Multiheight Probe stand as a solution for a wide variety of measurements. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
The Multiheight Probe can be supplied with 4 optional mounting holes which can accommodate optional mounting accessories such as an 8 inch wafer table or micropositioning X-Y stage.


Sorry, this entry is only available in Amerikan İngilizcesi.