|Measurement Range||1 mohm/square – 500 Megohms/square, 1 mohm.cm – 1 Megohm.cm|
|Units||mV ohm/square ohm.cm (wafers) ohm.cm (volume)|
|Onboard Memory||50 time-stamped measurements|
|Software||For operation and data control supplied free of charge|
|Autorange||Determines appropriate current settings|
|Current||10nA – 99.99mA, reversible to verify contact and measurement|
|Accuracy||0.3% across range, better than 0.1% in mid range|
|Connections||USB or RS-232|
|Correction||Option to input correction factor to adjust displayed readings|
|Ohm.cm||Option to input probe spacing or wafer thickness for auto calculation|
|AFPP||Powers and controls the optional automatic Z axis AFPP unit|
Measurements can be displayed on screen as mV, ohms/square or ohm.cm. There is a facility to input either probe spacing or wafer thickness so that ohm.cm values can be automatically calculated and displayed.
Computer connection and Software
The RM3000 can be connected to computer by either USB or RS-232 connection. The customer can operate the unit using the computer keyboard, terminal emulation software such as HyperTerminal, or with the free software provided.
If you require any further information on the Jandel RM3000 Test Unit please do not hesitate to contact us at Jandel using the details below