Jandel Hand Applied Probe

Jandel Engineering Limited offers the Hand Applied Probe as a solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots.
The probe head can have loads of up to 200g per needle and the Hand Applied Probe has a large downward force of around 1.2Kg and so is not suitable for fragile unsupported samples. As a scale for size the main image above shows the Hand Applied Probe sitting on top of a 150mm silicon ingot.

Description

Max. sample size Any reasonable size sample can be measured as long as the Hand Applied Probe can be placed appropriately
Max. sample thickness Any thickness of sample can be measured as long as the Hand Applied Probe can be placed appropriately
Toggle Switch Prevents current flow when probe is not in contact with the sample
Manual Placement Probe is designed to be placed and left while measurement is made to avoid fluctuation associated with hand held measurement
Simple set up Single wire connects the Hand Applied Probe and measurement electronics
Type Tip R Force Spacing
A 40u 100g 1mm
B 100u 100g 1mm
C 200u 100g 1mm
D 500u 70g 1mm
E 40u 200g 1.591mm
F 40u 100g 0.635mm
G 100u 100g 0.635mm
H 200u 100g 0.635mm
Type A-D and F-H are user adjustable in the range 60g-150g and supplied at value shown