Jandel Multiheight Four Point Probe Stand

Jandel Engineering Limited offers the Multiheight Probe stand as a solution for a wide variety of measurements. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
The Multiheight Probe can be supplied with 4 optional mounting holes which can accommodate optional mounting accessories such as an 8 inch wafer table or micropositioning X-Y stage.

Description

Max. sample size Samples up to 250mm diameter (300mm option at no extra cost)
Max. sample thickness Samples up to 250mm high can be measured (higher on request)
Microswitch Prevents current flow when probe is not in contact with the sample
Manual Control Simple lever operation for probe contact and removal
Simple set up Single wire connects the probe stand and measurement electronics
Mounting holes Optional sample tables are available
Automation Optional automated Z movement is available

System Configuration
Component parts:
A. Measurement Base – 1pc
B. Multiheight assembly – 1pc
C. Multiheight Column – 1pc
D. Four point probe head – 1pc
E. Connecting cable – 1pc
System Footprint
A. Multiheight Base: 250mm W x 290mm L x 8mm H (320mm x 370mm x 8mm option)
B. Multiheight Probe assembly: 60mm W x 280mm L x 80mm H (60mm x 330mm x
80mm option)
C. Multiheight Column: 19mm diameter, 200mm L (up to 1m on request)

Type Tip R Force Spacing
A 40u 100g 1mm
B 100u 100g 1mm
C 200u 100g 1mm
D 500u 70g 1mm
E 40u 200g 1.591mm
F 40u 100g 0.635mm
G 100u 100g 0.635mm
H 200u 100g 0.635mm
Type A-D and F-H are user adjustable in the range 60g-150g and supplied at value shown