Quasi-Steady-State µ-PCD whit Quality of Decay control (QSS µ-PCD QD). Quality control of wafers and solar cells at different stages of production.


Measured parameters:

  • Parameter free determination of Steady State Lifetime and Injection level
  • Surface Recombination Velocity (Smax)
  • Implied Voc
  • Emitter Saturation Current (J0)

Features and System specifications:

  • Fully automatic operation and data evaluation
  • Measurement selectable at any position on the wafer
  • Measurement of mono- and multi-crystalline material
  • Patented chemical surface passivation option available for wafers
  • Lifetime of wafers can be measured after each process step of solar cell manufacturing:
    • Incoming as-cut wafer
    • Diffused wafers (with or without phosphorous glass)
    • Nitride coated wafers
    • Metallized wafers
    • Finished solar cells
  • Advanced parameters (Smax, Voc, J0) can be measured after surface passivation steps