Description
Measured parameters:
- Parameter free determination of Steady State Lifetime and Injection level
- Surface Recombination Velocity (Smax)
- Implied Voc
- Emitter Saturation Current (J0)
Features and System specifications:
- Fully automatic operation and data evaluation
- Measurement selectable at any position on the wafer
- Measurement of mono- and multi-crystalline material
- Patented chemical surface passivation option available for wafers
- Lifetime of wafers can be measured after each process step of solar cell manufacturing:
- Incoming as-cut wafer
- Diffused wafers (with or without phosphorous glass)
- Nitride coated wafers
- Metallized wafers
- Finished solar cells
- Advanced parameters (Smax, Voc, J0) can be measured after surface passivation steps
