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Monocycle Generators

Avtech monocycle generators can provide a single cycle of RF at any frequency in the range 20 MHz to 5000 MHz, and find use in RF, ultrasound, radar, and UWB applications. Different models have different center frequency tuning characteristics. Some monocycle are approximately sinusoidal, and others are more rectangular in shape. See the datasheets for more information.

Contact Angle Meter

Model: HO-IAD-CAM-01
Compatible with glass, plastic & SS syringes
Manual dispensing with CMOS interface

Temporal δ Compton Camera

DESCRIPTION

Temporal δ is the first device to use this new concept. We are now proposing a portable version with one CeBr3 head, gamma ray and visible imaging and active temperature control. This version is dedicated to energies 300KeV – 2 MeV. This camera has the best angular resolution (6°) and timing resolution (300ps) on the market. It is also extremely sensitive allowing to image natural radioelements (4 kBq at 1 meter ̴ 4 hours) and good imaging of extended sources.

Thermal Testing

MicroXact offers a wide range of thermal solutions for wafer probing over a wide temperature range. Liquid nitrogen-cooled, closed-cycle solutions or convention-cooled wafer chucks are available with different sizes and various coatings and structures (isolated, grounded, coaxial, triaxial). Variable temperature probe stations in various configurations (with environmental enclosures for below 0°C testing, cooled platens for above 200°C testing)”

MicroXact’s Environmental Enclosure, compatible with our standard probe stations (SPS models), are designed to provide light shielding and protection against moisture.

For customers requiring testing in vacuum or controlled gas environment MicroXact offers ergonomic and highly customizable vacuum chambers.

Test Loads

Avtech offers a limited range of fast-pulse accessories designed for use with both general-purpose and Avtech sub-nanosecond pulse generators.

Theta 2 Theta Advanced Spectrophotometer

SPA216 Series

Optical Characterization
Precise measurement of spectral parameters