Description
Application
X-Art M is a versatile analyzer for determination of chemical composition in various objects including artworks. In the open air elements from Mg (Z=12) to U (Z=92) are analyzed simultaneously. Detection limit for the elements of moderate atomic number in light matrix is about 1 ppm. Detector crystal thickness of 3 to 5 mm provides high efficiency and in principle all heavy elements can be analyzed through K-series fluorescent lines.
Features
- On-line non-destructive qualitative and quantitative analysis of material composition directly at the object surface
- Arbitrary position of the analytical part in the space
- Small distance from the sample surface to the detector window which provides effective analysis of light elements
- Simple and convenient operation and service
Optional:
- Sample-to-detector air gap filled with Helium atmosphere to enhance the intensity of light element lines in the spectra detected
- Precise positioning system to change the distance between the sample surface and analytical unit for separate layer by layer spectra detection from sandwich-type objects
SPECIFICATION
| Parameter | Value |
|---|---|
| Locality of analysis | The spot at the object of 0.1 to 12 mm size |
| Excitation source | X-ray tube, Ag or Rh anode, HV 4 to 50 kV, anode current up to 1 mA |
| X-ray filtration | A set of changeable filters to optimize excitation of certain elements |
| Collimation | Changeable diaphragms of different diameters to analyze small sample areas |
| Detector type | Peltier cooled Si(Li) detector |
| Analytical part weight | 12 kg |
| Interface | Software compatible with PC or Notebook |
| Power supply | 220/110 V, 50/60 Hz or 12 V (optional) |
| Total power consumption | 140 W |
