The X-REF C12 is a desktop energy dispersive X-ray fluorescence spectrometer. X-REF C12 provides multielement analysis of samples from sodium (Na) to uranium (U), with concentration on the level of several ppm and up to dozens of percents. X-REF C12 developed for analysis of various nature and industrial materials.Superb analytical characteristics are provided by the application of direct excitation geometry and Silicon Drift Detector (SDD) with thin window. This combination guarantee good analytical parameters: excellent definition of elements, low detection limits, high accuracy and safety.Measurements could be done in air or in vacuum, depending on element number in periodic table. Capability to make measurements with helium is also provided.
|Excitation source||X-ray tube (Mo, Rh, Ag etc.). HV from 5 to 50 kV, Optionally: ultrathin window|
|Primary excitation filters||Changeable filter for optimization of specific elements excitation|
|Collimators||Changeable collimators for samples with various dimensions|
|Detector||SDD with ultrathin window|
|Measurement medium||Vacuum (for solid samples), helium (solid samples, powder or liquids), air (for elements from K, any samples)|
|Software||Applied software, Windows compatible|
|Power supply||230+ 5V, 50 Hz/ 250 VA|