The WT-2000D is a complete measurement tool for monitoring quality of silicon blocks by measuring Carrier recombination lifetime and resistivity. The system provides fast, non-contact measurements (single-point, line scans and/or maps) on silicon blocks in size up to 210x210x500 mm. It has manual and automatic measurement modes and manual block loading capabilities.

Carrier recombination lifetime is a primary quality control parameter for multi-crystalline silicon blocks. The measurement is based on µ-PCD technique.

Resistivity is measured based on eddy current technique.